Close up of examining a sample of microchip transistor with probe station under the microscope in laboratory.A semiconductor on a silicon wafer
RFID:Image ID:2B39BCJ
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Contributor:
Anatoly Morozov / Alamy Stock PhotoImage ID:
2B39BCJFile size:
40.4 MB (615.6 KB Compressed download)Releases:
Model - no | Property - noDo I need a release?Dimensions:
4604 x 3070 px | 39 x 26 cm | 15.3 x 10.2 inches | 300dpiDate taken:
12 December 2019More information:
Checking microchips on silicon wafer with probe station.Close up . Semiconductor Crystal Manufacturing.Selective focus.