Close up of examining a sample of microchip transistor with probe station under the microscope in laboratory.A semiconductor on a silicon wafer

RFID:2B39B0D

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Contributor:

Anatoly Morozov / Alamy Stock Photo

Image ID:

2B39B0D

File size:

27.8 MB (989.2 KB Compressed download)

Releases:

Model - no | Property - noDo I need a release?

Dimensions:

3819 x 2546 px | 32.3 x 21.6 cm | 12.7 x 8.5 inches | 300dpi

Date taken:

12 December 2019

More information:

Checking microchips on silicon wafer with probe station.Close up . Semiconductor Crystal Manufacturing.Selective focus.

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Close up of examining a sample of microchip transistor with probe station under the microscope in laboratory.A semiconductor on a silicon wafer

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